Occupation: Chief Technology Officer
Born: Harvey, Illinois, October 27, 1950
Education:
Trustee’s Research Fellowship for Distinguished Young Scholars (1992)
Henry Rutgers Research Fellowship, Rutgers, the State University of New Jersey (1986-1988)
PhD in Electrical Engineering, Carnegie Mellon University (1986)
MS in Computer Engineering, Carnegie Mellon University (1983)
BS in Electrical Engineering and Computer Science, Massachusetts Institute of Technology (MIT (1975)
Summer Internship, Ordnance Systems Division, General Electric Company (1972-1973)
Career:
Professor Emeritus, Rutgers, the State University of New Jersey (2013-Present)
Co-Founder, Chief Technological Officer, Spectral Design and Test, Inc. (2008-Present)
Professor, Electrical and Computer Engineering Department, CAIP Research Center, Wireless Information Networks Lab, Rutgers Center for Operations Research, School of Engineering, Rutgers, the State University of New Jersey(1986-2013)
Member, Technical Staff, Advanced System Development Department, Applicon, Inc. (1979-1981)
Senior Systems Programmer, Instron Corporation (Now Part of Illinois Tool Works) (1976-1979)
Associate Engineer, Design Automation Department, Honeywell Information Systems (1974-1976)
Civic:
Member, All Saint’s Episcopal Church, Princeton, NJ
Creative Works:
Co-Author, “Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits” (2000); Co-Author, “Efficient Branch and Bound Search with Application to Computer Aided Design” (1995); Co-Author, “Neural Models and Algorithms for Digital Testing” (1991); Author, “Design Automation” (1988); Author, Contributor, 29 Journal Articles and Electronic Publications; Author, Contributor, 78 Conference Papers in Proceedings; Author, 29 Technical Reports; Presenter, 56 Invited Presentations at Universities, Conferences, and Corporations
Achievements:
Holding eight U.S. patents and two European patents; Patent pending in robust delay fault built-in self-testing; Patent pending in robust delay fault built-in self-testing; Among 197 People to receive the NSF’s Presidential Young Investigator Award on a National Level.
Awards:
Selected, Top 100 Magazine “of leading academics and industrial researchers” (2019); Recipient, Fellow Award, IEEE (2008); Recipient, N. N. Biswas Best Student Paper Prize, “An Area Efficient Mixed-Signal Test Architecture for Systems-on-a-Chip,” International Conference on VLSI Design (2006); Recipient, Best Student Paper Prize, “New Graphical I_DDQ Signatures Reduce Defect Level and Yield Loss,” North Atlantic Test Workshop (2002); Recipient, Presidential Young Investigator Award, U.S. National Science Foundation (1990-1995); Grantee, Challenge Grant, Semiconductor Research Corporation (1989-1991); Grantee, Young Faculty Grant (1989-1991); Recipient, Presidential Young Investigator Award, The National Science Foundation (1990); Recipient, Outstanding Graduate Student Teaching Award, Carnegie Mellon University (1984); Recipient, Award of Merit, Paper, “Computerized Thermal Mechanics Fatigue Testing” (1977); Selected, Boston Chapter, Society for Technical Communication (1977); Recipient, Honorable Mention Award, Paper, “Test Generation for Mixed-Signal Devices Using Signal Flow Graphs,” Ninth International Conference on VLSI Design, 5000 Rupees; Grantee, Numerous Grants; Recipient, Albert Nelson Marquis Lifetime Achievement Award
Memberships:
Lifetime Fellow, Institute of Electrical and Electronics Engineers (IEEE) – Computer Society, Circuits and Systems Society, Communications Society; Member, Association for Computing Machinery; Member, VLSI Society of India (VSI)
Political Affiliation:
Democrat
Religion:
Episcopalian
Family:
Son of Cornelius Huntington Bushnell II and Josephine May (Blosser) Bushnell
Married: Margaret Elise Kalvar (10/01/1978)
Children: Amy Katherine; Megan Elizabeth
Hobbies:
Downhill skiing; Swimming; Tennis; Piano playing; Bridge; Horseback riding
Biography Sources:
Who’s Who in American Education – 1994-1995, 4th Edition (pub. 1993)
